Norm [AKTUELL]

BS IEC 62047-43
Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

Titel (englisch)

Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

Ausgabe 2024-03-22
Originalsprache Englisch
Preis ab 192,70 €
Kaufen bei DIN Media
Inhaltsverzeichnis