Norm
[AKTUELL]
UNE-EN 60749-40
UNE-EN 60749-40
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)
Titel (englisch)
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)