Norm-Entwurf
OEVE/OENORM EN 62951-1
OEVE/OENORM EN 62951-1
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates (IEC 47/2256/CDV) (english version)
Titel (englisch)
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates (IEC 47/2256/CDV) (english version)