Norm
[AKTUELL]
IEEE 63003
; IEEE 1505.1:2015
IEEE 63003
; IEEE 1505.1:2015
IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
Titel (englisch)
IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
