Norm
[AKTUELL]
ABNT NBR IEC 60749-30
ABNT NBR IEC 60749-30
Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices priorto reliability testing
Titel (englisch)
Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices priorto reliability testing
