NA 022
DKE Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE
Norm
[AKTUELL]
IEC 60749-30
IEC 60749-30
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Titel (englisch)
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
