Projekte von DKE/K 651

IEC 48B/1680/NP 2006-05-05 Future IEC 60352-X: Solderless connections - Part X: Compression mount connections - General requirements, test methods and practical guidance Mehr  Kontakt zu DIN 
IEC 48B/1598/DC 2005-12-16 IEC 60603-7 and IEC 60603-7-1 base document structure Mehr  Kontakt zu DIN 
IEC 48B/1554/CD 2005-10-07 IEC 60512-15-1 Ed.1: CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - Part 15-1:Connector tests (mechanical) - Test 15a: Contact retention in insert Mehr  Kontakt zu DIN 
IEC 48B/1555/CD 2005-10-07 IEC 60512-15-2 Ed.1: CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - Part 15-2: Connector tests (mechanical) - Test 15b: Insert retention in housing (axial) Mehr  Kontakt zu DIN 
IEC 48B/1556/CD 2005-10-07 IEC 60512-15-3 Ed.1: CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - Part 15-3: Connector tests (mechanical) - Test 15c: Insert retention in housing (torsional) Mehr  Kontakt zu DIN 
IEC 48B/1557/CD 2005-10-07 IEC 60512-15-4 Ed.1: CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - Part 15-4: Connector tests (mechanical) - Test 15d: Contact insertion, release and extraction force Mehr  Kontakt zu DIN 
IEC 48B/1558/CD 2005-10-07 IEC 60512-15-5 Ed.1: CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - Part 15-5: Connector tests (mechanical) - Test 15e: Contact retention in insert, cable nutation Mehr  Kontakt zu DIN 
IEC 48B/1559/CD 2005-10-07 IEC 60512-15-6 Ed.1: CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - Part 15-6: Connector tests (mechanical) - Test 15f: Effectiveness of connector coupling devices Mehr  Kontakt zu DIN 
IEC 48B/1560/CD 2005-10-07 IEC 60512-15-7 Ed.1: CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS- Part 15-7: Connector tests (mechanical) - Test 15g: Robustness of protective cover attachment Mehr  Kontakt zu DIN 
IEC 48B/1561/CD 2005-10-07 IEC 60512-16-1 Ed.1: CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage Mehr  Kontakt zu DIN