Projekte von DKE/UK 631.1

IEC 47E/299/NP 2006-03-31 (Future IEC 60747-14-6): Semiconductor devices - Discrete Devices - Part 14-6: Semiconductor sensors Test method of CMOS imagesensor module Mehr  Kontakt zu DIN 
IEC 47E/297/NP 2006-01-27 (Future IEC 60747-16-5): Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators Mehr  Kontakt zu DIN 
IEC 47E/293/NP 2005-12-02 (Future IEC 60747-14-5): Discrete semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor Mehr  Kontakt zu DIN 
IEC 47E/230/DC 2002-10-11 Maintenance of IEC 60747-9 and call for experts Mehr  Kontakt zu DIN 
IEC 47E/179/NP 2000-11-24 Semiconductor devices, Discrete devices, Semiconductor Flow Sensor Mehr  Kontakt zu DIN 
IEC 47E/147/DC 2000-02-11 Maintenance of IEC 60747-5-X series; IEC 60747-5-1, IEC 60747-5-2, IEC 60747-5-3 Mehr  Kontakt zu DIN 
IEC 47E/119/CDV 1998-09-11 IEC 60747-4: Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors - Integrated circuit microwave frequency prescalers Mehr  Kontakt zu DIN 
IEC 47E/200/FDIS 1997-10-17 IEC 60747-16-1, Ed.1: Semiconductor devices, Part 16-1: Microwave integrated circuits - Amplifiers Mehr  Kontakt zu DIN 
IEC 47E/100/NP 1997-09-26 Proposal of the Chinese NC: Amendment to IEC 60747-9: IGBTs Mehr  Kontakt zu DIN 
IEC 47E/84/CD 1997-03-21 Integrated circuit microwave frequency prescalers Mehr  Kontakt zu DIN 

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