NA 131
DIN Standards Committee Aerospace
DIN EN 2591-100 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| EN 2591-208 | 1996-02 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 208: Temperature rise due to rated current More |
| EN 2591-209 | 1996-02 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 209: Current temperature derating More |
| EN 2591-210 | 1998-06 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 210: Electrical overload More |
| EN 2591-211 | 2002-06 | Aerospace series - Elements of electrical and optical connection; Test methods - Part 211: Capacitance More |
| EN 2591-212 | 2005-10 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 212: Surface transfer impedance More |
| EN 2591-213 | 1997-10 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 213: Shielding effectiveness from 100 MHz to 1 GHz More |
| EN 2591-216 | 1997-10 | Aerospace series - Elements of electrical and optical connection - Test methods - Part 216: Engagement depth of contacts More |
| EN 2591-217 | 2002-06 | Aerospace series - Elements of electrical and optical connection; Test methods - Part 217: Voltage drop under specified current for terminal lugs and in-line splices More |
| EN 2591-218 | 2002-06 | Aerospace series - Elements of electrical and optical connection; Test methods - Part 218: Ageing of terminal lugs and in-line splices by temperature and current cycling More |
| EN 2591-219 | 2002-06 | Aerospace series - Elements of electrical and optical connection; Test methods - Part 219: Voltage strength for insulated terminal lugs and in-line splices More |
