NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 175301-801 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| EN 60512-25-4 | 2001-10 | Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d: Propagation delay (IEC 60512-25-4:2001) More |
| EN 60512-25-5 | 2004-09 | Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss (IEC 60512-25-5:2004) More |
| EN 60512-25-6 | 2004-07 | Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter (IEC 60512-25-6:2004) More |
| EN 60512-25-7 | 2005-03 | Connectors for electronic equipment - Tests and measurements - Part 25-7: Test 25g: Impedance, reflection coefficient and voltage standing wave ratio (VSWR) (IEC 60512-25-7:2004) More |
| EN 60512-2-6 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 2-6: Electrical continuity and contact resistance tests; Test 2f: Housing (shell) electrical continuity (IEC 60512-2-6:2002) More |
| EN 60512-3-1 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests; Test 3a: Insulation resistance (IEC 60512-3-1:2002) More |
| EN 60512-4-1 | 2003-07 | Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests; Test 4a: Voltage proof (IEC 60512-4-1:2003) More |
| EN 60512-4-2 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests; Test 4b: Partial discharge (IEC 60512-4-2:2002) More |
| EN 60512-4-3 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests; Test 4c: Voltage proof of pre-insulated crimp barrels (IEC 60512-4-3:2002) More |
| EN 60512-5-1 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests; Test 5a: Temperature rise (IEC 60512-5-1:2002) More |
