NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 175301-801 [CURRENT] references following documents:

Document number Edition Title
EN 60512-2-1 2002-04 Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests; Test 2a: Contact resistance; Millivolt level method (IEC 60512-2-1:2002) More 
EN 60512-2-2 2003-07 Connectors for electronic equipment - Tests and measurements - Part 2-2: Electrical continuity and contact resistance tests; Test 2b: Contact resistance; Specified test current method (IEC 60512-2-2:2003) More 
EN 60512-2-3 2002-04 Connectors for electronic equipment - Tests and measurements - Part 2-3: Electrical continuity and contact resistance tests; Test 2c: Contact resistance variation (IEC 60512-2-3:2002) More 
EN 60512-23-3 2001-02 Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 23-3: Test 23c: Shielding effectiveness of connectors and accessories (IEC 60512-23-3:2000) More 
EN 60512-23-4 2001-08 Connectors for electronic equipment - Tests and measurements - Part 23-4: Screening and filtering tests; Test 23d: Transmission line reflections in the time domain (IEC 60512-23-4:2001) More 
EN 60512-23-7 2005-03 Connectors for electronic equipment - Tests and measurements - Part 23-7: Screening and filtering tests - Test 23g: Effective transfer impedance of connectors (IEC 60512-23-7:2005) More 
EN 60512-2-5 2003-07 Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests; Test 2e: Contact disturbance (IEC 60512-2-5:2003) More 
EN 60512-25-1 2001-10 Connectors for electronic equipment - Tests and measurements - Part 25-1: Test 25a: Crosstalk ratio (IEC 60512-25-1:2001) More 
EN 60512-25-2 2002-06 Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b: Attenuation (insertion loss) (IEC 60512-25-2:2002) More 
EN 60512-25-3 2001-10 Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c: Rise time degradation (IEC 60512-25-3:2001) More