NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-3-106 [Withdrawn] references following documents:
Document number | Edition | Title |
---|---|---|
IEC 60512-25-6 | 2004-05 | Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter More |
IEC 60512-25-7 | 2004-12 | Connectors for electronic equipment - Tests and measurements - Part 25-7: Test 25g: Impedance, reflection coefficient, and voltage standing wave ratio (VSWR) More |
IEC 60512-2-6 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 2-6: Electrical continuity and contact resistance tests; Test 2f: Housing (shell) electrical continuity More |
IEC 60512-3-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests; Test 3a: Insulation resistance More |
IEC 60512-4-1 | 2003-05 | Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests; Test 4a: Voltage proof More |
IEC 60512-4-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests; Test 4b: Partial discharge More |
IEC 60512-4-3 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests; Test 4c: Voltage proof of pre-insulated crimp barrels More |
IEC 60512-5-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests; Test 5a: Temperature rise More |
IEC 60512-5-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating More |
IEC 60512-6 | 1984 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 6 : Climatic tests and soldering tests More |