NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-3-112 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| EN 60512-23-4 | 2001-08 | Connectors for electronic equipment - Tests and measurements - Part 23-4: Screening and filtering tests; Test 23d: Transmission line reflections in the time domain (IEC 60512-23-4:2001) More |
| EN 60512-23-7 | 2005-03 | Connectors for electronic equipment - Tests and measurements - Part 23-7: Screening and filtering tests - Test 23g: Effective transfer impedance of connectors (IEC 60512-23-7:2005) More |
| EN 60512-2-5 | 2003-07 | Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests; Test 2e: Contact disturbance (IEC 60512-2-5:2003) More |
| EN 60512-25-1 | 2001-10 | Connectors for electronic equipment - Tests and measurements - Part 25-1: Test 25a: Crosstalk ratio (IEC 60512-25-1:2001) More |
| EN 60512-25-2 | 2002-06 | Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b: Attenuation (insertion loss) (IEC 60512-25-2:2002) More |
| EN 60512-25-3 | 2001-10 | Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c: Rise time degradation (IEC 60512-25-3:2001) More |
| EN 60512-25-4 | 2001-10 | Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d: Propagation delay (IEC 60512-25-4:2001) More |
| EN 60512-25-5 | 2004-09 | Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss (IEC 60512-25-5:2004) More |
| EN 60512-25-6 | 2004-07 | Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter (IEC 60512-25-6:2004) More |
| EN 60512-25-7 | 2005-03 | Connectors for electronic equipment - Tests and measurements - Part 25-7: Test 25g: Impedance, reflection coefficient and voltage standing wave ratio (VSWR) (IEC 60512-25-7:2004) More |
