NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-3-112 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60512-5-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating More |
| IEC 60512-6 | 1984 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 6 : Climatic tests and soldering tests More |
| IEC 60512-6-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests; Test 6a: Acceleration, steady state More |
| IEC 60512-6-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests; Test 6b: Bump More |
| IEC 60512-6-3 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests; Test 6c: Shock More |
| IEC 60512-6-4 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests; Test 6d: Vibration (sinusoidal) More |
| IEC 60512-6-5 | 1997-10 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6: Dynamic stress tests - Section 5: Test 6e: Random vibration More |
| IEC 61076-1 | 2006-04 | Connectors for electronic equipment - Product requirements - Part 1: Generic specification More |
