NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62197-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60512-6-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests; Test 6b: Bump More |
| IEC 60512-6-3 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests; Test 6c: Shock More |
| IEC 60512-6-4 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests; Test 6d: Vibration (sinusoidal) More |
| IEC 60512-6-5 | 1997-10 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6: Dynamic stress tests - Section 5: Test 6e: Random vibration More |
| ISO 2859-1 | 1999-11 | Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection More |
| QC 001002-2 | 1998-06 | IEC quality assessment system for electronic components (IECQ) - Rules of procedure - Part 2: Documentation More |
| QC 210000 | 1995-12 | Technology approval schedules - Requirements under the IECQ Quality Assessment System for Electronic Components (IECQ) More |
