NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 61810-7 [CURRENT] references following documents:

Document number Edition Title
IEC 60749-8 2002-08 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing More 
IEC 60749-8 Corrigendum 1 2003-04 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing More 
IEC 60749-8 Corrigendum 2 2003-08 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing More