NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-2-102 [CURRENT] references following documents:
Document number | Edition | Title |
---|---|---|
EN 61076-2 | 1999-04 | Connectors for use in d.c. low-frequency analogue and digital high-speed data applications - Part 2: Circular connectors with assessed quality - Sectional specification (IEC 61076-2:1998) More |
IEC 60512-1-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination; Test 1a: Visual examination More |
IEC 60512-11-10 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 11-10: Climatic tests; Test 11j: Cold More |
IEC 60512-11-11 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 11-11: Climatic tests; Test 11k: Low air pressure More |
IEC 60512-11-12 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 11-12: Climatic tests; Test 11m: Damp heat, cyclic More |
IEC 60512-11-13 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 11-13: Climatic tests; Test 11n: Gas tightness, solderless wrapped connections More |
IEC 60512-11-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 11-2: Climatic tests; Test 11b: Combined/sequential cold, low air pressure and damp heat More |
IEC 60512-11-3 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 11-3: Climatic tests; Test 11c: Damp heat, steady state More |
IEC 60512-11-4 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 11-4: Climatic tests; Test 11d: Rapid change of temperature More |
IEC 60512-11-5 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 11-5: Climatic tests; Test 11e: Mould growth More |