NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-4-108 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60512-25-3 | 2001-07 | Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c; Rise time degradation More |
| IEC 60512-25-4 | 2001-07 | Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d; Propagation delay More |
| IEC 60512-2-6 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 2-6: Electrical continuity and contact resistance tests; Test 2f: Housing (shell) electrical continuity More |
| IEC 60512-3-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests; Test 3a: Insulation resistance More |
| IEC 60512-4-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests; Test 4b: Partial discharge More |
| IEC 60512-4-3 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests; Test 4c: Voltage proof of pre-insulated crimp barrels More |
| IEC 60512-5-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests; Test 5a: Temperature rise More |
| IEC 60512-5-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating More |
| IEC 60512-6-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests; Test 6a: Acceleration, steady state More |
| IEC 60512-6-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests; Test 6b: Bump More |
