NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-4-108 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| EN 60512-25-1 | 2001-10 | Connectors for electronic equipment - Tests and measurements - Part 25-1: Test 25a: Crosstalk ratio (IEC 60512-25-1:2001) More |
| EN 60512-25-2 | 2002-06 | Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b: Attenuation (insertion loss) (IEC 60512-25-2:2002) More |
| EN 60512-25-3 | 2001-10 | Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c: Rise time degradation (IEC 60512-25-3:2001) More |
| EN 60512-25-4 | 2001-10 | Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d: Propagation delay (IEC 60512-25-4:2001) More |
| EN 60512-2-6 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 2-6: Electrical continuity and contact resistance tests; Test 2f: Housing (shell) electrical continuity (IEC 60512-2-6:2002) More |
| EN 60512-3-1 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests; Test 3a: Insulation resistance (IEC 60512-3-1:2002) More |
| EN 60512-4-2 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests; Test 4b: Partial discharge (IEC 60512-4-2:2002) More |
| EN 60512-4-3 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests; Test 4c: Voltage proof of pre-insulated crimp barrels (IEC 60512-4-3:2002) More |
| EN 60512-5-1 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests; Test 5a: Temperature rise (IEC 60512-5-1:2002) More |
| EN 60512-5-2 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating (IEC 60512-5-2:2002) More |
