NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60352-2 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60512-16-20 | 1996-08 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 16: Mechanical tests on contacts and terminations - Section 20: Test 16t: Mechanical strength (wired termination of solderless connections) More |
| IEC 60512-19-3 | 1997-07 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 19: Chemical resistance tests - Section 3: Test 19c: Fluid resistance More |
| IEC 60512-20-2 | 2000-04 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 20-2: Test 20b - Flammability tests - Fireproofness More |
| IEC 60512-2-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests; Test 2a: Contact resistance - Millivolt level method More |
| IEC 60512-2-3 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 2-3: Electrical continuity and contact resistance tests; Test 2c: Contact resistance variation More |
| IEC 60512-23-4 | 2001-06 | Connectors for electronic equipment - Tests and measurements - Part 23-4: Screening and filtering tests; Test 23d: Transmission line reflections in the time domain More |
| IEC 60512-25-1 | 2001-07 | Connectors for electronic equipment - Tests and measurements - Part 25-1: Test 25a; Crosstalk ratio More |
| IEC 60512-25-2 | 2002-03 | Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b - Attenuation (insertion loss) More |
| IEC 60512-25-3 | 2001-07 | Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c; Rise time degradation More |
| IEC 60512-25-4 | 2001-07 | Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d; Propagation delay More |
