NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-7 [CURRENT] references following documents:
Document number | Edition | Title |
---|---|---|
IEC 60512-4-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests; Test 4b: Partial discharge More |
IEC 60512-4-3 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests; Test 4c: Voltage proof of pre-insulated crimp barrels More |
IEC 60512-5-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests; Test 5a: Temperature rise More |
IEC 60512-5-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating More |
IEC 60512-6-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests; Test 6a: Acceleration, steady state More |
IEC 60512-6-2 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests; Test 6b: Bump More |
IEC 60512-6-3 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests; Test 6c: Shock More |
IEC 60512-6-4 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests; Test 6d: Vibration (sinusoidal) More |
IEC 60512-6-5 | 1997-10 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6: Dynamic stress tests - Section 5: Test 6e: Random vibration More |
IEC 60512-7-1 | 2010-03 | Connectors for electronic equipment - Tests and measurements - Part 7-1: Impact tests (free components) - Test 7a: Free fall (repeated) More |