NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN IEC/TR 62222 [CURRENT] references following documents:

Document number Edition Title
IEC 60794-1-303 2023-04 Optical fibre cables - Part 1-303: Generic specification - Basic optical cable test procedures - Ribbon dimensions - Aperture gauge, method G3 More 
IEC 60794-1-305 2023-01 Optical fibre cables - Part 1-305: Generic specification - Basic optical cable test procedures - Cable element test methods - Ribbon tear (separability), Method G5 More 
IEC 60794-1-306 2023-09 Optical fibre cables - Part 1-306: Generic specification - Basic optical cable test procedures - Cable element test methods - Ribbon torsion, Method G6 More 
IEC 60794-1-308 2023-02 Optical fibre cables - Part 1-308: Generic specification - Basic optical cable test procedures - Cable element test methods - Ribbon residual twist test, method G8 More 
IEC 60794-1-309 2023-04 Optical fibre cables - Part 1-309: Generic specification - Basic optical cable test procedures - Cable element test methods - Bleeding and evaporation of filling or flooding compounds, Method G9 More 
IEC 60794-1-31 2021-06 Optical fibre cables - Part 1-31: Generic specification - Optical cable elements - Optical fibre ribbon More 
IEC 60794-1-310 2022-04 Optical fibre cables - Part 1-310: Generic specification - Basic optical cable test procedures - Cable element test methods - Strippability, method G10 More 
IEC 60794-1-311 2024-01 Optical fibre cables - Part 1-311: Generic specification - Basic optical cable test procedures - Cable element test methods - Tensile strength and elongation test for cable elements, Method G11A More 
IEC 60794-1-312 2024-01 Optical fibre cables - Part 1-312: Generic specification - Basic optical cable test procedures - Cable element test methods - Elongation test for buffer tubes at low temperature, Method G11B More 
IEC 60794-1-401 2021-07 Optical fibre cables - Part 1-401: Generic specification - Basic optical cable test procedures - Electrical test methods - Short-circuit test (for OPGW, OPPC and OPAC), Method H1 More