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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62149-12 ; VDE 0886-149-12:2024-02 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 61300-2-4 | 2019-01 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre or cable retention More |
| IEC 61300-2-48 | 2009-03 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling More |
| IEC 62149-1 | 2011-12 | Fibre optic active components and devices - Performance standards - Part 1: General and guidance More |
| DIN EN IEC 60749-10 | 2023-12 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022 More |
| DIN EN IEC 60749-12 | 2018-07 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (IEC 60749-12:2017); German version EN IEC 60749-12:2018 More |
| DIN EN IEC 60749-26 ; VDE 0884-749-26 | 2018-10 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018 More |
| DIN EN IEC 61300-2-4 | 2022-09 | Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre or cable retention (IEC 61300-2-4:2019 + A1:2020); German version EN IEC 61300-2-4:2019 + A1:2020 More |
| DIN EN 60749-11 | 2003-04 | Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method (IEC 60749-11:2002); German version EN 60749-11:2002 More |
| DIN EN 60749-25 | 2004-04 | Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling (IEC 60749-25:2003); German version EN 60749-25:2003 More |
| DIN EN 60749-6 | 2017-11 | Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017 More |
