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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 60947-4-2 ; VDE 0660-117:2024-02 [CURRENT] references following documents:
Document number | Edition | Title |
---|---|---|
IEC 61000-4-3 | 2020-09 | Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency electromagnetic field immunity test More |
IEC 61000-4-30 | 2015-02 | Electromagnetic compatibility (EMC) - Part 4-30: Testing and measurement techniques - Power quality measurement methods More |
IEC 61000-4-30 AMD 1 | 2021-03 | Electromagnetic compatibility (EMC) - Part 4-30: Testing and measurement techniques - Power quality measurement methods; Amendment 1 More |
IEC 61000-4-30 Corrigendum 1 | 2016-12 | Electromagnetic compatibility (EMC) - Part 4-30: Testing and measurement techniques - Power quality measurement methods; Corrigendum 1 More |
IEC 61000-4-30 Edition 3.1 | 2021-03 | Electromagnetic compatibility (EMC) - Part 4-30: Testing and measurement techniques - Power quality measurement methods More |
IEC 61000-4-31 | 2016-07 | Electromagnetic compatibility (EMC) - Part 4-31: Testing and measurement techniques - AC mains ports broadband conducted disturbance immunity test More |
IEC 61000-4-32 | 2002-10 | Electromagnetic compatibility (EMC) - Part 4-32: Testing and measurement techniques; High-altitude electromagnetic impulse HEMP simulator compendium More |
IEC 61000-4-33 | 2005-09 | Electromagnetic compatibility (EMC) - Part 4-33: Testing and measurement techniques - Measurement methods for high-power transient parameters More |
IEC 61000-4-34 | 2005-10 | Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current more than 16 A per phase More |
IEC 61000-4-34 AMD 1 | 2009-05 | Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current more than 16 A per phase; Amendment 1 More |