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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62435-7 ; VDE 0884-135-7:2022-10 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| DIN EN 62435-2 ; VDE 0884-135-2:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017); German version EN 62435-2:2017 More |
| DIN EN 62435-5 ; VDE 0884-135-5:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017); German version EN 62435-5:2017 More |
| EIA JESD 89A | 2006-10 | Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices More |
| EIA J-STD-075A | 2018-05 | Classification of Passive and Solid State Devices for Assembly Processes More |
| IEC 60050-561 | 2014-11 | International electrotechnical vocabulary - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection More |
| IEC/TR 62258-3 | 2010-08 | Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage More |
| IPC JEDEC J-STD-033D | 2018-03-01 | Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices More |
