NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62435-8 ; VDE 0884-135-8:2022-11 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| DIN EN 62435-5 ; VDE 0884-135-5:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017); German version EN 62435-5:2017 More |
| EIA JESD 89A | 2006-10 | Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices More |
| IEC 60721-3-1 | 2018-02 | Classification of environmental conditions - Part 3-1: Classification of groups of environmental parameters and their severities - Storage More |
| IEC 62435-1 | 2017-01 | Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General More |
| IEC 62435-2 | 2017-01 | Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms More |
| IEC 62435-3 | 2020-02 | Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data More |
| IEC 62435-4 | 2018-06 | Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage More |
| IEC 62435-5 | 2017-01 | Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices More |
| IEC 62435-6 | 2018-08 | Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices More |
| IEC 62435-7 | 2020-12 | Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices More |
