NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 61760-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| ISO 25178-605 | 2014-02 | Geometrical product specifications (GPS) - Surface texture: Areal - Part 605: Nominal characteristics of non-contact (point autofocus probe) instruments More |
| ISO 25178-606 | 2015-06 | Geometrical product specification (GPS) - Surface texture: Areal - Part 606: Nominal characteristics of non-contact (focus variation) instruments More |
| ISO 25178-607 | 2019-03 | Geometrical product specifications (GPS) - Surface texture: Areal - Part 607: Nominal characteristics of non-contact (confocal microscopy) instruments More |
| ISO 25178-70 | 2014-02 | Geometrical product specification (GPS) - Surface texture: Areal - Part 70: Material measures More |
| ISO 25178-701 | 2010-07 | Geometrical product specifications (GPS) - Surface texture: Areal - Part 701: Calibration and measurement standards for contact (stylus) instruments More |
| ISO 25178-71 | 2017-08 | Geometrical product specifications (GPS) - Surface texture: Areal - Part 71: Software measurement standards More |
| ISO 25178-72 | 2017-05 | Geometrical product specifications (GPS) - Surface texture: Areal - Part 72: XML file format x3p More |
| ISO 25178-72 AMD 1 | 2020-09 | Geometrical product specifications (GPS) - Surface texture: Areal - Part 72: XML file format x3p; Amendment 1 More |
| ISO 25178-73 | 2019-05 | Geometrical product specifications (GPS) - Surface texture: Areal - Part 73: Terms and definitions for surface defects on material measures More |
