NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN ISO 11929-1 ; VDE 0493-9291:2021-11 [CURRENT] references following documents:
Document number | Edition | Title |
---|---|---|
DIN ISO 7503-1 ; VDE 0493-2-5031:2017-12 | 2017-12 | Measurement of radioactivity - Measurement and evaluation of surface contamination - Part 1: General principles (ISO 7503-1:2016) More |
DIN ISO 7503-2 ; VDE 0493-2-5032:2017-12 | 2017-12 | Measurement of radioactivity - Measurement and evaluation of surface contamination - Part 2: Test method using wipe-test samples (ISO 7503-2:2016) More |
DIN ISO 7503-3 ; VDE 0493-2-5033:2017-12 | 2017-12 | Measurement of radioactivity - Measurement and evaluation of surface contamination - Part 3: Apparatus calibration (ISO 7503-3:2016) More |
IEC/TR 62461 | 2015-01 | Radiation protection instrumentation - Determination of uncertainty in measurement More |
ISO 10703 | 2021-06 | Water quality - Gamma-ray emitting radionuclides - Test method using high resolution gamma-ray spectrometry More |
ISO 11665-1 | 2019-09 | Measurement of radioactivity in the environment - Air: radon-222 - Part 1: Origins of radon and its short-lived decay products and associated measurement methods More |
ISO 11665-11 | 2016-04 | Measurement of radioactivity in the environment - Air: radon-222 - Part 11: Test method for soil gas with sampling at depth More |
ISO 11665-2 | 2019-09 | Measurement of radioactivity in the environment - Air: radon-222 - Part 2: Integrated measurement method for determining average potential alpha energy concentration of its short-lived decay products More |
ISO 11665-3 | 2020-01 | Measurement of radioactivity in the environment - Air: radon-222 - Part 3: Spot measurement method of the potential alpha energy concentration of its short-lived decay products More |
ISO 11665-4 | 2021-03 | Measurement of radioactivity in the environment - Air: radon-222 - Part 4: Integrated measurement method for determining average activity concentration using passive sampling and delayed analysis More |