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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 60947-4-3 ; VDE 0660-109:2000-09 [Withdrawn] references following documents:

Document number Edition Title
IEC 61000-4-13 Edition 1.2 2015-12 Electromagnetic compatibility (EMC) - Part 4-13: Testing and measurement techniques - Harmonics and interharmonics including mains signalling at a.c. power port, low frequency immunity tests More 
IEC 61000-4-14 1999-02 Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test More 
IEC 61000-4-14 AMD 1 2001-07 Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques; Voltage fluctuation immunity test; Amendment 1 More 
IEC 61000-4-14 AMD 2 2009-05 Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase; Amendment 2 More 
IEC 61000-4-14 Edition 1.1 2002-07 Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques; Voltage fluctuation immunity test More 
IEC 61000-4-14 Edition 1.2 2009-08 Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase More 
IEC 61000-4-15 2010-08 Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications More 
IEC 61000-4-15 Corrigendum 1 2012-03 Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications; Corrigendum 1 More 
IEC 61000-4-15 Interpretation Sheet 1 2017-08 Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications; Interpretation Sheet 1 More 
IEC 61000-4-16 2015-12 Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz More