NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 50174-1 ; VDE 0800-174-1:2020-10 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| ISO 2859-1 Technical Corrigendum 1 | 2001-03 | Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection; Technical Corrigendum 1 More |
| ISO 2859-2 | 2020-02 | Sampling procedures for inspection by attributes - Part 2: Sampling plans indexed by limiting quality (LQ) for isolated lot inspection More |
| ISO 2859-3 | 2005-05 | Sampling procedures for inspection by attributes - Part 3: Skip-lot sampling procedures More |
| ISO 2859-4 | 2020-06 | Sampling procedures for inspection by attributes - Part 4: Procedures for assessment of declared quality levels More |
| ISO 2859-5 | 2005-06 | Sampling procedures for inspection by attributes - Part 5: System of sequential sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection More |
