NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 61784-2 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| ISO 15745-1 | 2003-03 | Industrial automation systems and integration - Open systems application integration framework - Part 1: Generic reference description More |
| ISO/IEC TR 10000-1 | 1998-11 | Information technology - Framework and taxonomy of International Standardized Profiles - Part 1: General principles and documentation framework More |
| ISO/IEC 9646-1 | 1994-12 | Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 1: General concepts More |
| ISO/IEC 9646-2 | 1994-12 | Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 2: Abstract test suite specification More |
| ISO/IEC 9646-3 | 1998-11 | Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 3: The Tree and Tabular Combined Notation (TTCN) More |
| ISO/IEC 9646-4 | 1994-12 | Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 4: Test realization More |
| ISO/IEC 9646-5 | 1994-12 | Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 5: Requirements on test laboratories and clients for the conformance assessment process More |
| ISO/IEC 9646-6 | 1994-12 | Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 6: Protocol profile test specification More |
| ISO/IEC 9646-7 | 1995-09 | Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 7: Implementation conformance statements More |
| ISO/IEC 9646-7 Technical Corrigendum 1 | 1997-04 | Information technology - Open Systems Interconnection - Conformance testing methodology and framework - Part 7: Implementation conformance statements; Technical corrigendum 1 More |
