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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN IEC/TS 62933-5-1 ; VDE V 0520-933-5-1:2020-04 references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 61000-4-14 | 1999-02 | Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test More |
| IEC 61000-4-14 AMD 1 | 2001-07 | Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques; Voltage fluctuation immunity test; Amendment 1 More |
| IEC 61000-4-14 AMD 2 | 2009-05 | Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase; Amendment 2 More |
| IEC 61000-4-14 Edition 1.1 | 2002-07 | Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques; Voltage fluctuation immunity test More |
| IEC 61000-4-14 Edition 1.2 | 2009-08 | Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase More |
| IEC 61000-4-15 | 2010-08 | Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications More |
| IEC 61000-4-15 Corrigendum 1 | 2012-03 | Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications; Corrigendum 1 More |
| IEC 61000-4-15 Interpretation Sheet 1 | 2017-08 | Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications; Interpretation Sheet 1 More |
| IEC 61000-4-16 | 2015-12 | Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz More |
| IEC 61000-4-17 | 1999-06 | Electromagnetic compatibility (EMC) - Part 4-17: Testing and measuring techniques - Ripple on d.c. input power port, immunity test More |
