NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 61967-1 ; VDE 0847-21-1:2019-09 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 61967-6 | 2002-06 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method More |
| IEC 62132-1 | 2015-10 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions More |
| IEC/TS 61967-3 | 2014-08 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method More |
