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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62435-4 ; VDE 0884-135-4:2019-05 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| DIN EN 62435-1 ; VDE 0884-135-1:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017); German version EN 62435-1:2017 More |
| DIN EN 62435-2 ; VDE 0884-135-2:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms (IEC 62435-2:2017); German version EN 62435-2:2017 More |
| DIN EN 62435-5 ; VDE 0884-135-5:2017-10 | 2017-10 | Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (IEC 62435-5:2017); German version EN 62435-5:2017 More |
| IEC 60050-551 | 1998-11 | International Electrotechnical Vocabulary - Part 551: Power electronics More |
| IEC 60068-2-17 | 1994-07 | Basic environmental testing procedures - Part 2: Tests - Test Q: Sealing More |
| IEC 60721-3-1 | 2018-02 | Classification of environmental conditions - Part 3-1: Classification of groups of environmental parameters and their severities - Storage More |
| IEC 61340-5-1 | 2016-05 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements More |
| IEC 62258-1 | 2009-04 | Semiconductor die products - Part 1: Procurement and use More |
| IEC 62258-2 | 2011-05 | Semiconductor die products - Part 2: Exchange data formats More |
| IEC 62258-5 | 2006-08 | Semiconductor die products - Part 5: Requirements for information concerning electrical simulation More |
