NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN IEC 62239-1 [CURRENT] references following documents:

Document number Edition Title
IEC 61967-6 AMD 1 2008-03 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method; Amendment 1 More 
IEC 61967-6 Corrigendum 1 2010-08 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method More 
IEC 61967-6 Edition 1.1 2008-06 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method More 
IEC 61967-8 2011-08 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method More 
IEC 62132-1 2015-10 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions More 
IEC 62132-2 2010-03 Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method More 
IEC 62132-3 2007-09 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method More 
IEC 62132-4 2006-02 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method More 
IEC 62132-5 2005-10 Integrated cicuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method More 
IEC 62132-8 2012-07 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method More