NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62239-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 61967-6 AMD 1 | 2008-03 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method; Amendment 1 More |
| IEC 61967-6 Corrigendum 1 | 2010-08 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method More |
| IEC 61967-6 Edition 1.1 | 2008-06 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method More |
| IEC 62132-1 | 2015-10 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions More |
| IEC 62132-2 | 2010-03 | Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method More |
| IEC 62132-3 | 2007-09 | Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method More |
| IEC 62132-4 | 2006-02 | Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method More |
| IEC 62132-5 | 2005-10 | Integrated cicuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method More |
| IEC 62132-8 | 2012-07 | Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method More |
| IEC 62435-1 | 2017-01 | Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General More |
