NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62435-6 ; VDE 0884-135-6:2019-04 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 62435-5 | 2017-01 | Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices More |
| IEC 62435-6 | 2018-08 | Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices More |
| ISO 2859-1 | 1999-11 | Sampling procedures for inspection by attributes - Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection More |
