NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN IEC 60749-26 ; VDE 0884-749-26 [CURRENT] references following documents:

Document number Edition Title
IEC 60749-8 Corrigendum 2 2003-08 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing More 
IEC 60749-9 2017-03 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking More