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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN IEC 62969-1 ; VDE 0884-69-1:2018-08 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 61967-2 | 2005-09 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method More |
| IEC 61967-5 | 2003-02 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday cage method More |
| IEC 61967-6 | 2002-06 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method More |
| IEC 62132-1 | 2015-10 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions More |
| IEC 62132-2 | 2010-03 | Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method More |
| IEC 62132-3 | 2007-09 | Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method More |
| IEC 62132-4 | 2006-02 | Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method More |
| IEC 62132-5 | 2005-10 | Integrated cicuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method More |
| IEC 62262 | 2002-02 | Degrees of protection provided by enclosures for electrical equipment against external mechanical impacts (IK code) More |
| IEC/TS 61967-3 | 2014-08 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method More |
