NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61360-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60748-4 ; QC 790300:1997-04 | 1997-04 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits More |
| IEC 60748-4-1 ; QC 790303:1993-11 | 1993-11 | Semiconductor devices; integrated circuits; part 4: interface integrated circuits; section 1: blank detail specification for linear digital-to-analogue converters (DAC) More |
| IEC 60748-4-2 ; QC 790304:1993-11 | 1993-11 | Semiconductor devices; integrated circuits; Part 4: interface integrated circuits; section 2: blank detail specification for linear analogue-to-digital converters (ADC) More |
| IEC 60748-4-3 | 2006-08 | Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC) More |
| IEC 60748-5 | 1997-05 | Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits More |
| IEC 61360-2 | 2012-10 | Standard data element types with associated classification scheme for electric components - Part 2: EXPRESS dictionary schema More |
| IEC 61987-1 | 2006-12 | Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 1: Measuring equipment with analogue and digital output More |
| IEC 61987-10 | 2009-07 | Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 10: Lists of properties (LOPs) for industrial-process measurement and control for electronic data exchange - Fundamentals More |
| IEC 61987-10 Corrigendum 1 | 2012-05 | Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 10: Lists of properties (LOPs) for industrial-process measurement and control for electronic data exchange - Fundamentals; Corrigendum 1 More |
| IEC 61987-11 | 2016-12 | Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 11: Lists of properties (LOPs) of measuring equipment for electronic data exchange - Generic structures More |
