NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-2-113 ; VDE 0687-2-113:2018-02 [CURRENT] references following documents:
Document number | Edition | Title |
---|---|---|
IEC 60512-17-1 | 2010-06 | Connectors for electronic equipment - Tests and measurements - Part 17-1: Cable clamping tests - Test 17a: Cable clamp robustness More |
IEC 60512-17-2 | 2011-04 | Connectors for electronic equipment - Tests and measurements - Part 17-2: Cable clamping tests - Test 17b: Cable clamp resistance to cable rotation More |
IEC 60512-17-3 | 2010-06 | Connectors for electronic equipment - Tests and measurements - Part 17-3: Cable clamping tests - Test 17c: Cable clamp resistance to cable pull (tensile) More |
IEC 60512-17-4 | 2010-06 | Connectors for electronic equipment - Tests and measurements - Part 17-4: Cable clamping tests - Test 17d: Cable clamp resistance to cable torsion More |
IEC 60512-19-1 | 2010-03 | Connectors for electronic equipment - Tests and measurements - Part 19-1: Chemical resistance tests - Test 19a: Fluid resistance of pre-insulated crimp barrels More |
IEC 60512-19-3 | 1997-07 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 19: Chemical resistance tests - Section 3: Test 19c: Fluid resistance More |
IEC 60512-20-1 | 2010-06 | Connectors for electronic equipment - Tests and measurements - Part 20-1: Fire hazard tests - Test 20a: Flammability, needle-flame More |
IEC 60512-20-2 | 2000-04 | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 20-2: Test 20b - Flammability tests - Fireproofness More |
IEC 60512-20-3 | 2010-06 | Connectors for electronic equipment - Tests and measurements - Part 20-3: Fire hazard tests - Test 20c: Flammability, glow-wire More |
IEC 60512-2-1 | 2002-02 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests; Test 2a: Contact resistance - Millivolt level method More |