NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62433-2 ; VDE 0847-33-2:2017-10 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 61967-6 Corrigendum 1 | 2010-08 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method More |
| IEC 61967-6 Edition 1.1 | 2008-06 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method More |
| ISO 8879 | 1986-10 | Information processing; Text and office systems; Standard Generalized Markup Language (SGML) More |
