NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 62435-5 ; VDE 0884-135-5:2017-10 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60749-3 | 2017-03 | Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination More |
| IEC 61340-2-1 | 2015-08 | Electrostatics - Part 2-1: Measurement methods - Ability of materials and products to dissipate static electric charge More |
| IEC 61340-5-1 | 2016-05 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements More |
| IEC 62435-1 | 2017-01 | Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General More |
| IEC 62435-5 | 2017-01 | Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices More |
| IEC/TR 62258-3 | 2010-08 | Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage More |
| IEC/TS 61945 | 2000-03 | Integrated circuits - Manufacturing line approval - Methodology for technology and failure analysis More |
