NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61076-2-104 ; VDE 0687-76-2-104:2015-06 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60512-23-4 | 2001-06 | Connectors for electronic equipment - Tests and measurements - Part 23-4: Screening and filtering tests; Test 23d: Transmission line reflections in the time domain More |
| IEC 60512-23-7 | 2005-01 | Connectors for electronic equipment - Tests and measurements - Part 23-7: Screening and filtering tests - Test 23g: Effective transfer impedance of connectors More |
| IEC 60512-24-1 | 2010-03 | Connectors for electronic equipment - Tests and measurements - Part 24-1: Magnetic interference tests - Test 24a: Residual magnetism More |
| IEC 60512-2-5 | 2003-05 | Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests; Test 2e: Contact disturbance More |
| IEC 60512-25-1 | 2001-07 | Connectors for electronic equipment - Tests and measurements - Part 25-1: Test 25a; Crosstalk ratio More |
| IEC 60512-25-2 | 2002-03 | Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b - Attenuation (insertion loss) More |
| IEC 60512-25-3 | 2001-07 | Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c; Rise time degradation More |
| IEC 60512-25-4 | 2001-07 | Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d; Propagation delay More |
| IEC 60512-25-5 | 2004-07 | Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss More |
| IEC 60512-25-6 | 2004-05 | Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter More |
