NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61747-10-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60068-4 AMD 1 | 1992-02 | Basic environmental testing procedures; part 4: information for specification writers; test summaries; amendment 1 More |
| IEC 60068-4 AMD 2 | 1994-03 | Basic environmental testing procedures; part 4: information for specification writers; test summaries; amendment 2 More |
| IEC 60068-5-2 | 1990-12 | Environmental testing; part 5: guide to drafting of test methods; terms and definitions More |
| IEC 60747-1 | 2006-02 | Semiconductor devices - Part 1: General More |
| IEC 60747-1 AMD 1 | 2010-05 | Semiconductor devices - Part 1: General More |
| IEC 60747-1 Corrigendum 1 | 2008-09 | Semiconductor devices - Part 1: General; Corrigendum 1 More |
| IEC 60747-1 Edition 2.1 | 2010-08 | Semiconductor devices - Part 1: General More |
| IEC 60747-14-1 | 2010-01 | Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors More |
| IEC 60747-14-2 | 2000-11 | Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements More |
| IEC 60747-14-3 | 2009-04 | Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors More |
