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DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61747-10-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60748-3 AMD 2 | 1994-01 | Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 2 More |
| IEC 60748-3 AMD 2 Corrigendum 1 | 1996-06 | Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 2 More |
| IEC 60748-3-1 ; QC 790202:1991-07 | 1991-07 | Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; section 1: blank detail specification for monolithic integrated operational amplifiers More |
| IEC 60748-4 ; QC 790300:1997-04 | 1997-04 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits More |
| IEC 60748-4-1 ; QC 790303:1993-11 | 1993-11 | Semiconductor devices; integrated circuits; part 4: interface integrated circuits; section 1: blank detail specification for linear digital-to-analogue converters (DAC) More |
| IEC 60748-4-2 ; QC 790304:1993-11 | 1993-11 | Semiconductor devices; integrated circuits; Part 4: interface integrated circuits; section 2: blank detail specification for linear analogue-to-digital converters (ADC) More |
| IEC 60748-4-3 | 2006-08 | Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC) More |
| IEC 60748-5 | 1997-05 | Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits More |
| IEC 60749-14 | 2003-08 | Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) More |
| IEC 61747-10-1 | 2013-07 | Liquid crystal display devices - Part 10-1: Mechanical test methods More |
