NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 61076-4-116 ; VDE 0687-76-4-116:2012-11 [Withdrawn] references following documents:

Document number Edition Title
IEC 60512-26-100 2008-07 Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g More 
IEC 60512-26-100 AMD 1 2011-03 Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g More 
IEC 60512-26-100 Edition 1.1 2011-05 Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g More 
IEC 60512-27-100 2011-12 Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on IEC 60603-7 series connectors - Tests 27a to 27g More 
IEC 60512-3-1 2002-02 Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests; Test 3a: Insulation resistance More 
IEC 60512-4-1 2003-05 Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests; Test 4a: Voltage proof More 
IEC 60512-4-2 2002-02 Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests; Test 4b: Partial discharge More 
IEC 60512-4-3 2002-02 Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests; Test 4c: Voltage proof of pre-insulated crimp barrels More 
IEC 60512-5-1 2002-02 Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests; Test 5a: Temperature rise More 
IEC 60512-5-2 2002-02 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating More