NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 50173-1 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| EN 60512-25-1 | 2001-10 | Connectors for electronic equipment - Tests and measurements - Part 25-1: Test 25a: Crosstalk ratio (IEC 60512-25-1:2001) More |
| EN 60512-25-2 | 2002-06 | Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b: Attenuation (insertion loss) (IEC 60512-25-2:2002) More |
| EN 60512-25-4 | 2001-10 | Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d: Propagation delay (IEC 60512-25-4:2001) More |
| EN 60512-25-5 | 2004-09 | Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss (IEC 60512-25-5:2004) More |
| EN 60512-25-9 | 2008-11 | Connectors for electrical equipment - Tests and measurements - Part 25-9: Signal integrity tests - Test 25i: Alien crosstalk (IEC 60512-25-9:2008) More |
| EN 60512-4-2 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests; Test 4b: Partial discharge (IEC 60512-4-2:2002) More |
| EN 60512-6-2 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests; Test 6b: Bump (IEC 60512-6-2:2002) More |
| EN 60512-6-3 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests; Test 6c: Shock (IEC 60512-6-3:2002) More |
| EN 60512-6-4 | 2002-04 | Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests; Test 6d: Vibration (sinusoidal) (IEC 60512-6-4:2002) More |
| EN 60529 | 1991-10 | Degrees of protection provided by enclosures (IP code) (IEC 60529:1989) More |
