NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 50173-1 [Withdrawn] references following documents:

Document number Edition Title
DIN EN 60512-25-1 2002-08 Connectors for electronic equipment - Tests and measurements - Part 25-1: Test 25a: Crosstalk ratio (IEC 60512-25-1:2001); German version EN 60512-25-1:2001 More 
DIN EN 60512-25-2 2002-12 Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b: Attenuation (insertion loss) (IEC 60512-25-2:2002); German version EN 60512-25-2:2002 More 
DIN EN 60512-25-4 2002-08 Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d: Propagation delay (IEC 60512-25-4:2001); German version EN 60512-25-4:2001 More 
DIN EN 60512-25-5 2005-05 Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss (IEC 60512-25-5:2004); German version EN 60512-25-5:2004 More 
DIN EN 60512-25-9 2009-08 Connectors for electronic equipment - Tests and measurements - Part 25-9: Signal integrity tests - Test 25i: Alien crosstalk (IEC 60512-25-9:2008); German version EN 60512-25-9:2008 More 
DIN EN 60512-3-1 2003-01 Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests; Test 3a: Insulation resistance (IEC 60512-3-1:2002); German version EN 60512-3-1:2002 More 
DIN EN 60512-4-1 2004-01 Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof (IEC 60512-4-1:2003); German version EN 60512-4-1:2003 More 
DIN EN 60512-4-2 2003-01 Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests; Test 4b: Partial discharge (IEC 60512-4-2:2002); German version EN 60512-4-2:2002 More 
DIN EN 60512-5-2 2003-01 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating (IEC 60512-5-2:2002); German version EN 60512-5-2:2002 More 
DIN EN 60512-6-2 2003-01 Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests; Test 6b: Bump (IEC 60512-6-2:2002); German version EN 60512-6-2:2002 More