NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60749-34 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60747-1 | 2006-02 | Semiconductor devices - Part 1: General More |
| IEC 60749-23 | 2004-02 | Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life More |
| IEC 60747-1 AMD 1 | 2010-05 | Semiconductor devices - Part 1: General More |
| IEC 60747-1 Corrigendum 1 | 2008-09 | Semiconductor devices - Part 1: General; Corrigendum 1 More |
| IEC 60747-1 Edition 2.1 | 2010-08 | Semiconductor devices - Part 1: General More |
| IEC 60747-14-1 | 2010-01 | Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors More |
| IEC 60747-14-2 | 2000-11 | Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements More |
| IEC 60747-14-3 | 2009-04 | Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors More |
| IEC 60747-14-4 | 2011-01 | Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers More |
| IEC 60747-14-5 | 2010-02 | Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor More |
