NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

DIN EN 50152-2 ; VDE 0115-320-2:2008-06 [Withdrawn] references following documents:

Document number Edition Title
EN 61000-4-20 2003-04 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques; Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2003) More 
EN 61000-4-20/A1 2007-06 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2003/A1:2006) More 
EN 61000-4-21 2003-10 Electromagnetic Compatibility (EMC) - Part 4-21: Testing and measurement techniques; Reverberation chamber test methods (IEC 61000-4-21:2003) More 
EN 61000-4-23 2000-12 Electromagnetic compatibility (EMC) - Part 4-23: Testing and measurement techniques; Test methods for protective devices for HEMP and other radiated disturbances (IEC 61000-4-23:2000) More 
EN 61000-4-24 1997-05 Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 24: Test methods for protective devices for HEMP conducted disturbance - Basic EMC publication (IEC 61000-4-24:1997) More 
EN 61000-4-25 2002-03 Electromagnetic compatibility (EMC) - Part 4-25: Testing and measuring techniques - HEMP immunity test methods for equipment and systems (IEC 61000-4-25:2001) More 
EN 61000-4-27 2000-11 Electromagnetic compatibility (EMC) - Part 4-27: Testing and measurement techniques; Unbalance, immunity test (IEC 61000-4-27:2000) More 
EN 61000-4-28 2000-03 Electromagnetic compatibility (EMC) - Part 4-28: Testing and measurement techniques - Variation of power frequency, immunity test (IEC 61000-4-28:1999) More 
EN 61000-4-28/A1 2004-05 Electromagnetic compatibility (EMC) - Part 4-28: Testing and measurement techniques; Variation of power frequency, immunity test (IEC 61000-4-28:1999/A1:2001) More 
EN 61000-4-29 2000-11 Electromagnetic Compatibility (EMC) - Part 4-29: Testing and measurement techniques; Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests (IEC 61000-4-29:2000) More